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Mean Time to Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 9: MTTF

Density MTTF (Operating Hours)

120GB 2 million

240GB 2 million

480GB 2 million

800GB 2 million

Note:

1. The product achieves a MTTF of 2 million hours based on population statistics not rele-

vant to individual units.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. Total bytes written measured with 55°C case tem-

perature within the total bytes written values listed in this document. The table below

shows the drive lifetime for each SSD density based on predefined usage conditions.

Table 10: Drive Lifetime

Density Drive Lifetime (Total Bytes Written)

120GB 0.5PB

240GB 1.0PB

480GB 1.9PB

800GB 1.9PB

Note:

1. Total bytes written were calculated assuming drive is 100% full (user capacity) and a

workload of 100% random, aligned 4KB writes.

M500DC 1.8-Inch NAND Flash SSD

Reliability

PDF: 09005aef854f62f9

M500DC_1_8_disti.pdf - Rev. D 4/14 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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