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Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 6: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

<1 sector per 10

bits read READ

Mean Time To Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 7: MTTF

Capacity MTTF (Operating Hours)

128GB 1.5 million

256GB 1.5 million

512GB 1.5 million

1024GB 1.5 million

Note:

1. The product achieves a mean time to failure (MTTF) of 1.5 million hours, based on popu-

lation statistics not relevant to individual units.

M600 2.5-Inch NAND Flash SSD

Reliability

PDF: 09005aef858ae778

m600_2_5_ssd.pdf - Rev. E 3/15 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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